An Zhu
Ph.D., Professor, Doctoral Supervisor
Main research areas:
1) atomic inner-shell ionization and bremsstrahlung by electron/positron impact; 2) ion beam analysis; 3) beta-ray induced X-ray spectrometry (BIXS) for tritium analysis; 4) nuclear reaction and nuclear structure.
Contact information:
Tel: (+86) 28-85412811;E-mail: anzhu@scu.edu.cn
Professor, Ph.D.
Institute of Nuclear Science and Technology, Sichuan University
Chengdu 610064
P.R. China
Tel: (+86) 28-85412811
E-mail: anzhu@scu.edu.cn
Education
1989.09—1992.12, China Institute of Atomic Energy, Ph.D.
1986.09—1989.07, Sichuan University, M.S.
1982.09—1986.06, Sichuan University, B.S.
Interests
● Atomic inner-shell ionization and bremsstrahlung by electron/positron impact
● Ion beam analysis techniques
● Beta-ray induced X-ray spectrometry (BIXS) for tritium analysis
● Nuclear reaction and nuclear structure.
代表性论文和成果Selected Publications and Achievements：
(For the updated paper list, please see the following websites)
1. An Z, Li TH, Wang LM, et al. Correction of substrate effect in the measurement of 8-25keV electron-impact K-shell ionization cross sections of Cu and Co elements. Phys Rev A, 1996, 54:3067.
2. An Z and Hou Q. Inverse problem in the thick-target method of measurements of inner-shell ionization cross sections by electron or positron impact. Phys Rev A, 2008, 77: 042702.
3. An Z, Tang CH, Zhou CG, et al. Measurement of Sc and V K-shell ionization cross sections by electron impact. J Phys B, 2000, 33: 3677.
4. An Z, Hou Q and Long JJ. Reconstruction of depth distribution of tritium in materials by beta-ray induced x-ray spectrometry. Nucl Instr and Methods B, 2008, 266:3643.
5. An Z, Wu Y, Liu MT, et al. Thick-target method in the measurement of inner-shell ionization cross-sections by low-energy electron impact. Nucl Instr and Methods B, 2006, 246: 281.
Websites
ORCID: http://orcid.org/0000-0002-2285-3712
ResearcherID: http://www.researcherid.com/rid/L-5000-2016
ResearchGate: https://www.researchgate.net/profile/Zhu_An2
