Associate Professor, Ph.D.

Institute of Nuclear Science & Technology, Sichuan University

Chengdu 610064

P.R.China

Tel: (86)028-85412732

Email: zhujingjun@scu.edu.cn

Education:

2000--2005, Tsinghua University, Ph.D

1996--2000, Tsinghua University, B.S

Interests

• Inner shell ionization cross section detection

Atomic inner-shell ionization cross sections by electron or positron are very important not only for better understanding electron or positron-atom interactions but also for a lot of applications in radiation physics, astrophysics, plasma physics, and electron or positron-matter interaction modeling, as well as in quantitative analysis (electron probe microanalysis, Auger electron spectroscopy, and electron energy loss spectroscopy).

• Nuclear analysis technique and applications

Nuclear analysis technique for example, RBS, PIXE, BIXS, and so on, is widely used in research of material science, component analysis and trace element analysis.

• Dark matter research and Low background detection

In rare events experiment, for example, dark matter research and double beta decay, background suppression and detection is very important. Well understanding of the background is helpful for analysis of experiment data.

代表性论文和成果Selected Publications and Achievements：

[1] J.L. Zhao, Z. An, J.J. Zhu, et al. Measurements of Lα, Lβ, Lγ and M X-ray production cross sections of Os, Ir and Pt by low-energy electron impact: Comparisons of experiment with theory, Radiation Physics and Chemistry, 134, 2017, 71-82

[2] J. J. Zhu, Y. Wu, Z. An. Electron-impact inner shell ionization crosssection measurements for heavy element impurities in fusion reactors, IAEA: Atomic and Plasma–material Interaction Data for fusion, 17, 2017, 85-98

[3] J.L. Zhao, Z. An, J.J. Zhu, et al. Investigations of L-shell X-ray production cross sections of In and Sn by low-energy electron impact, Journal of Physics B: Atomic Molecular and Optical Physics, 49(6), 2016, 065205

[4] C.X. Zhang, S.T. Lin, J.L. Zhao, et al. Discrimination of neutrons and γ-rays in liquid scintillator based on Elman neural network, Chinese Physics C, 40(8), 2016, 08620

[5] X.L Li, J.L Zhao, L.X Tian, et al. Measurements of inner-shell characteristic X-ray yields of thick W, Mo and Zr targets by low-energy electron impact and comparison with Monte Carlo simulations，Nucl. Instr. And Meth. B, 333, 2014, 106-112

[6] T. Fu, Z. An, J.J. Zhu, et al. Tritium and helium analyses in thin films by enhanced proton backscattering, Chinese Physics C, 38 (8), 2014, 088203

[7] J.J Zhu, Z An, M.T Liu, et al. Measurements of the K-shell ionization cross sections of Si by 3-25-keV electron impact using the thick-target method, Physical Review A, 79(5), 2009, 052710